SUKANYA, G.; SAVITHRI, T. S. VLSI Architecture for Edge Detection of Leaf Images. Transactions on Engineering and Computing Sciences, [S. l.], v. 13, n. 02, p. 134–143, 2025. DOI: 10.14738/tmlai.1302.18612. Disponível em: https://www.journals.scholarpublishing.org/index.php/TMLAI/article/view/18612. Acesso em: 7 dec. 2025.