CHANANA, R. K. Summary of the Electrical Properties of a MOS Device on Various Semiconductors . European Journal of Applied Sciences, [S. l.], v. 13, n. 05, p. 242–244, 2025. DOI: 10.14738/aivp.1305.19457. Disponível em: https://www.journals.scholarpublishing.org/index.php/AIVP/article/view/19457. Acesso em: 5 dec. 2025.